Jin-Fu Li, Cheng-Wen Wu, Cheng-Wen Wu, Masahiro Aoyagi, Meng-Fan Marvin Chang, Ding-Ming Kwai. Special session 4C: Hot topic 3D-IC design and test. In 31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013. pages 1, IEEE Computer Society, 2013. [doi]
Abstract is missing.