On reducing both shift and capture power for scan-based testing - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Jia Li, Qiang Xu, Yu Hu, Xiaowei Li. On reducing both shift and capture power for scan-based testing. In Proceedings of the 13th Asia South Pacific Design Automation Conference, ASP-DAC 2008, Seoul, Korea, January 21-24, 2008. pages 653-658, IEEE, 2008. [doi]

This author has not been identified. Look up 'Jia Li' in GoogleThis author has not been identified. Look up 'Qiang Xu' in GoogleThis author has not been identified. Look up 'Yu Hu' in GoogleThis author has not been identified. Look up 'Xiaowei Li' in Google

runs on WebDSL