Jia Li, Qiang Xu, Yu Hu, Xiaowei Li. On reducing both shift and capture power for scan-based testing. In Proceedings of the 13th Asia South Pacific Design Automation Conference, ASP-DAC 2008, Seoul, Korea, January 21-24, 2008. pages 653-658, IEEE, 2008. [doi]
@inproceedings{LiXHL08,
title = {On reducing both shift and capture power for scan-based testing},
author = {Jia Li and Qiang Xu and Yu Hu and Xiaowei Li},
year = {2008},
doi = {10.1109/ASPDAC.2008.4484032},
url = {http://dx.doi.org/10.1109/ASPDAC.2008.4484032},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/LiXHL08},
cites = {0},
citedby = {0},
pages = {653-658},
booktitle = {Proceedings of the 13th Asia South Pacific Design Automation Conference, ASP-DAC 2008, Seoul, Korea, January 21-24, 2008},
publisher = {IEEE},
}