A Novel Test Method for Metallic CNTs in CNFET-Based SRAMs - researchr publication authors

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Tianjian Li, Feng Xie, Xiaoyao Liang, Qiang Xu, Krishnendu Chakrabarty, Naifeng Jing, Li Jiang. A Novel Test Method for Metallic CNTs in CNFET-Based SRAMs. IEEE Trans. on CAD of Integrated Circuits and Systems, 35(7):1192-1205, 2016. [doi]

This author has not been identified. Look up 'Tianjian Li' in GoogleThis author has not been identified. Look up 'Feng Xie' in GoogleThis author has not been identified. Look up 'Xiaoyao Liang' in GoogleThis author has not been identified. Look up 'Qiang Xu' in GoogleThis author has not been identified. Look up 'Krishnendu Chakrabarty' in GoogleThis author has not been identified. Look up 'Naifeng Jing' in GoogleThis author has not been identified. Look up 'Li Jiang' in Google

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