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Tianjian Li, Feng Xie, Xiaoyao Liang, Qiang Xu, Krishnendu Chakrabarty, Naifeng Jing, Li Jiang. A Novel Test Method for Metallic CNTs in CNFET-Based SRAMs. IEEE Trans. on CAD of Integrated Circuits and Systems, 35(7):1192-1205, 2016. [doi]