Chih-Feng Li, Shao-Sheng Yang, Tsin-Yuan Chang. On-chip accumulated jitter measurement for phase-locked loops. In Ting-Ao Tang, editor, Proceedings of the 2005 Conference on Asia South Pacific Design Automation, ASP-DAC 2005, Shanghai, China, January 18-21, 2005. pages 1184-1187, ACM Press, 2005. [doi]
@inproceedings{LiYC05:3,
title = {On-chip accumulated jitter measurement for phase-locked loops},
author = {Chih-Feng Li and Shao-Sheng Yang and Tsin-Yuan Chang},
year = {2005},
doi = {10.1145/1120725.1120936},
url = {http://doi.acm.org/10.1145/1120725.1120936},
researchr = {https://researchr.org/publication/LiYC05%3A3},
cites = {0},
citedby = {0},
pages = {1184-1187},
booktitle = {Proceedings of the 2005 Conference on Asia South Pacific Design Automation, ASP-DAC 2005, Shanghai, China, January 18-21, 2005},
editor = {Ting-Ao Tang},
publisher = {ACM Press},
isbn = {0-7803-8737-6},
}