Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST

Huaguo Liang, Sybille Hellebrand, Hans-Joachim Wunderlich. Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. J. Electronic Testing, 18(2):159-170, 2002. [doi]

Authors

Huaguo Liang

This author has not been identified. Look up 'Huaguo Liang' in Google

Sybille Hellebrand

This author has not been identified. Look up 'Sybille Hellebrand' in Google

Hans-Joachim Wunderlich

This author has not been identified. Look up 'Hans-Joachim Wunderlich' in Google