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Huaguo Liang, Sybille Hellebrand, Hans-Joachim Wunderlich. Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. J. Electronic Testing, 18(2):159-170, 2002. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Two-dimensional test data compression for scan-based deterministic BISTHuaguo Liang, Sybille Hellebrand, Hans-Joachim Wunderlich. itc 2001: 894-902 A new technique for deterministic scan based built in self test (BIST)Huaguo Liang. PhD thesis, University of Stuttgart, Germany, 2003. [doi]
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