Huaguo Liang, Sybille Hellebrand, Hans-Joachim Wunderlich. Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. J. Electronic Testing, 18(2):159-170, 2002. [doi]
@article{LiangHW02:0,
title = {Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST},
author = {Huaguo Liang and Sybille Hellebrand and Hans-Joachim Wunderlich},
year = {2002},
doi = {10.1023/A:1014993509806},
url = {http://dx.doi.org/10.1023/A:1014993509806},
tags = {rule-based, testing, data-flow},
researchr = {https://researchr.org/publication/LiangHW02%3A0},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {18},
number = {2},
pages = {159-170},
}