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Test Patterns of Multiple SIC Vectors: Theory and Application in BIST Schemes

Feng Liang, Luwen Zhang, ShaoChong Lei, Guohe Zhang, Kaile Gao, Bin Liang. Test Patterns of Multiple SIC Vectors: Theory and Application in BIST Schemes. IEEE Trans. VLSI Syst., 21(4):614-623, 2013. [doi]

Authors

Feng Liang

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Luwen Zhang

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ShaoChong Lei

This author has not been identified. Look up 'ShaoChong Lei' in Google

Guohe Zhang

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Kaile Gao

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Bin Liang

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