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Feng Liang, Luwen Zhang, ShaoChong Lei, Guohe Zhang, Kaile Gao, Bin Liang. Test Patterns of Multiple SIC Vectors: Theory and Application in BIST Schemes. IEEE Trans. VLSI Syst., 21(4):614-623, 2013. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: A Class of SIC Circuits: Theory and Application in BIST DesignShaoChong Lei, Xueyan Hou, ZhiBiao Shao, Feng Liang. tcas, 55-II(2):161-165, 2008. [doi]
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