Feng Liang, Luwen Zhang, ShaoChong Lei, Guohe Zhang, Kaile Gao, Bin Liang. Test Patterns of Multiple SIC Vectors: Theory and Application in BIST Schemes. IEEE Trans. VLSI Syst., 21(4):614-623, 2013. [doi]
@article{LiangZLZGL13,
title = {Test Patterns of Multiple SIC Vectors: Theory and Application in BIST Schemes},
author = {Feng Liang and Luwen Zhang and ShaoChong Lei and Guohe Zhang and Kaile Gao and Bin Liang},
year = {2013},
doi = {10.1109/TVLSI.2012.2195689},
url = {http://dx.doi.org/10.1109/TVLSI.2012.2195689},
researchr = {https://researchr.org/publication/LiangZLZGL13},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {21},
number = {4},
pages = {614-623},
}