Chen-Wei Lin, Mango Chia-Tso Chao, Chih-Chieh Hsu. Novel Circuit-Level Model for Gate Oxide Short and its Testing Method in SRAMs. IEEE Trans. VLSI Syst., 22(6):1294-1307, 2014. [doi]
@article{LinCH14,
title = {Novel Circuit-Level Model for Gate Oxide Short and its Testing Method in SRAMs},
author = {Chen-Wei Lin and Mango Chia-Tso Chao and Chih-Chieh Hsu},
year = {2014},
doi = {10.1109/TVLSI.2013.2268984},
url = {http://dx.doi.org/10.1109/TVLSI.2013.2268984},
researchr = {https://researchr.org/publication/LinCH14},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {22},
number = {6},
pages = {1294-1307},
}