Novel Circuit-Level Model for Gate Oxide Short and its Testing Method in SRAMs

Chen-Wei Lin, Mango Chia-Tso Chao, Chih-Chieh Hsu. Novel Circuit-Level Model for Gate Oxide Short and its Testing Method in SRAMs. IEEE Trans. VLSI Syst., 22(6):1294-1307, 2014. [doi]

Abstract

Abstract is missing.