SIFAR: Static Test Compaction for Synchronous Sequential Circuits Based on Single Fault Restoration - researchr publication authors

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Xijiang Lin, Wu-Tung Cheng, Irith Pomeranz, Sudhakar M. Reddy. SIFAR: Static Test Compaction for Synchronous Sequential Circuits Based on Single Fault Restoration. In 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada. pages 205-212, IEEE Computer Society, 2000. [doi]

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