The following publications are possibly variants of this publication:
- Reverse-order-restoration-based static test compaction for synchronous sequential circuitsRuifeng Guo, Sudhakar M. Reddy, Irith Pomeranz. tcad, 22(3):293-304, 2003. [doi]
- Static test compaction for synchronous sequential circuits based on vector restorationIrith Pomeranz, Sudhakar M. Reddy, Ruifeng Guo. tcad, 18(7):1040-1049, 1999. [doi]
- Vector Restoration Based Static Compaction of Test Sequences for Synchronous Sequential CircuitsIrith Pomeranz, Sudhakar M. Reddy. iccd 1997: 360-365
- Procedures for Static Compaction of Test Sequences for Synchronous Sequential Circuits Based on Vector RestorationRuifeng Guo, Irith Pomeranz, Sudhakar M. Reddy. date 1998: 583 [doi]
- On Static Compaction of Test Sequences for Synchronous Sequential CircuitsIrith Pomeranz, Sudhakar M. Reddy. dac 1996: 215-220 [doi]
- On Maximizing the Fault Coverage for a Given Test Length Limit in a Synchronous Sequential CircuitIrith Pomeranz, Sudhakar M. Reddy. TC, 53(9):1121-1133, 2004. [doi]
- On Maximizing the Fault Coverage for a Given Test Length Limit in a Synchronous Sequential CircuitIrith Pomeranz, Sudhakar M. Reddy. vts 2003: 173-178 [doi]
- On Speeding-Up Vector Restoration Based Static Compaction of Test Sequences for Sequential Circuits Ruifeng Guo, Irith Pomeranz, Sudhakar M. Reddy. ats 1998: 467-471 [doi]
- Dynamic Test Compaction for Synchronous Sequential Circuits using Static Compaction TechniquesIrith Pomeranz, Sudhakar M. Reddy. ftcs 1996: 53-61
- EXTEST: a method to extend test sequences of synchronous sequential circuits to increase the fault coverageIrith Pomeranz, Sudhakar M. Reddy. vts 1997: 329-335 [doi]
- Increasing Fault Coverage for Synchronous Sequential Circuits by the Multiple Observation Time Test StrategyIrith Pomeranz, Sudhakar M. Reddy, Lakshmi N. Reddy. iccad 1991: 454-457