Xijiang Lin, Wu-Tung Cheng, Irith Pomeranz, Sudhakar M. Reddy. SIFAR: Static Test Compaction for Synchronous Sequential Circuits Based on Single Fault Restoration. In 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada. pages 205-212, IEEE Computer Society, 2000. [doi]
@inproceedings{LinCPR00,
title = {SIFAR: Static Test Compaction for Synchronous Sequential Circuits Based on Single Fault Restoration},
author = {Xijiang Lin and Wu-Tung Cheng and Irith Pomeranz and Sudhakar M. Reddy},
year = {2000},
url = {http://csdl.computer.org/comp/proceedings/vts/2000/0613/00/06130205abs.htm},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/LinCPR00},
cites = {0},
citedby = {0},
pages = {205-212},
booktitle = {18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada},
publisher = {IEEE Computer Society},
isbn = {0-7695-0613-5},
}