Jyi-Tsong Lin, Yi-Chuen Eng, Tai-Yi Lee, Kao-Cheng Lin. Analysis of Si-body thickness variation for a new 40 nm gate length bFDSOI. In 20th International Conference on VLSI Design (VLSI Design 2007), Sixth International Conference on Embedded Systems (ICES 2007), 6-10 January 2007, Bangalore, India. pages 653-656, IEEE Computer Society, 2007. [doi]
Abstract is missing.