Interconnect Reliability Analysis for Power Amplifier Based on Artificial Neural Networks - researchr publication authors

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Qian Lin, Haipeng Fu, Feifei He, Qian-Fu Cheng. Interconnect Reliability Analysis for Power Amplifier Based on Artificial Neural Networks. J. Electronic Testing, 32(4):481-489, 2016. [doi]

This author has not been identified. Look up 'Qian Lin' in GoogleThis author has not been identified. Look up 'Haipeng Fu' in GoogleThis author has not been identified. Look up 'Feifei He' in GoogleThis author has not been identified. Look up 'Qian-Fu Cheng' in Google

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