Qian Lin, Haipeng Fu, Feifei He, Qian-Fu Cheng. Interconnect Reliability Analysis for Power Amplifier Based on Artificial Neural Networks. J. Electronic Testing, 32(4):481-489, 2016. [doi]
@article{LinFHC16,
title = {Interconnect Reliability Analysis for Power Amplifier Based on Artificial Neural Networks},
author = {Qian Lin and Haipeng Fu and Feifei He and Qian-Fu Cheng},
year = {2016},
doi = {10.1007/s10836-016-5606-0},
url = {http://dx.doi.org/10.1007/s10836-016-5606-0},
researchr = {https://researchr.org/publication/LinFHC16},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {32},
number = {4},
pages = {481-489},
}