A Scan Matrix Design for Low Power Scan-Based Test

Shih-Ping Lin, Chung-Len Lee, Jwu E. Chen. A Scan Matrix Design for Low Power Scan-Based Test. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 224-229, IEEE Computer Society, 2005. [doi]

Authors

Shih-Ping Lin

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Chung-Len Lee

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Jwu E. Chen

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