A Scan Matrix Design for Low Power Scan-Based Test

Shih-Ping Lin, Chung-Len Lee, Jwu E. Chen. A Scan Matrix Design for Low Power Scan-Based Test. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 224-229, IEEE Computer Society, 2005. [doi]

Abstract

Abstract is missing.