Shih-Ping Lin, Chung-Len Lee, Jwu E. Chen. A Scan Matrix Design for Low Power Scan-Based Test. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 224-229, IEEE Computer Society, 2005. [doi]
@inproceedings{LinLC05:3,
title = {A Scan Matrix Design for Low Power Scan-Based Test},
author = {Shih-Ping Lin and Chung-Len Lee and Jwu E. Chen},
year = {2005},
doi = {10.1109/ATS.2005.14},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2005.14},
tags = {design science, rule-based, testing, e-science, design},
researchr = {https://researchr.org/publication/LinLC05%3A3},
cites = {0},
citedby = {0},
pages = {224-229},
booktitle = {14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India},
publisher = {IEEE Computer Society},
isbn = {0-7695-2481-8},
}