Xijiang Lin, Irith Pomeranz, Sudhakar M. Reddy. Techniques for improving the efficiency of sequential circuit test generation. In Jacob K. White, Ellen Sentovich, editors, Proceedings of the 1999 IEEE/ACM International Conference on Computer-Aided Design, 1999, San Jose, California, USA, November 7-11, 1999. pages 147-151, IEEE, 1999. [doi]
Abstract is missing.