On static test compaction and test pattern ordering for scan designs - researchr publication authors

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Xijiang Lin, Janusz Rajski, Irith Pomeranz, Sudhakar M. Reddy. On static test compaction and test pattern ordering for scan designs. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 1088-1097, IEEE Computer Society, 2001.

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