Xijiang Lin, Janusz Rajski, Irith Pomeranz, Sudhakar M. Reddy. On static test compaction and test pattern ordering for scan designs. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 1088-1097, IEEE Computer Society, 2001.
@inproceedings{LinRPR01,
title = {On static test compaction and test pattern ordering for scan designs},
author = {Xijiang Lin and Janusz Rajski and Irith Pomeranz and Sudhakar M. Reddy},
year = {2001},
tags = {testing},
researchr = {https://researchr.org/publication/LinRPR01},
cites = {0},
citedby = {0},
pages = {1088-1097},
booktitle = {Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001},
publisher = {IEEE Computer Society},
isbn = {0-7803-7169-0},
}