ANOVA model based moving window approach for RtR control in high-mix semiconductor manufacturing industry

D. Ling, Y. Zheng, H. J. Fang, H. J. Fan, J. Zhao. ANOVA model based moving window approach for RtR control in high-mix semiconductor manufacturing industry. In European Control Conference, ECC 2013, Zurich, Switzerland, July 17-19, 2013. pages 3949-3954, IEEE, 2013. [doi]

Authors

D. Ling

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Y. Zheng

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H. J. Fang

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H. J. Fan

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J. Zhao

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