Experience in critical path selection for deep sub-micron delay test and timing validation - researchr publication authors

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Jing-Jia Liou, Li-C. Wang, Angela Krstic, Kwang-Ting Cheng. Experience in critical path selection for deep sub-micron delay test and timing validation. In Hiroto Yasuura, editor, Proceedings of the 2003 Asia and South Pacific Design Automation Conference, ASP-DAC '03, Kitakyushu, Japan, January 21-24, 2003. pages 751-756, ACM, 2003. [doi]

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