Jing-Jia Liou, Li-C. Wang, Angela Krstic, Kwang-Ting Cheng. Experience in critical path selection for deep sub-micron delay test and timing validation. In Hiroto Yasuura, editor, Proceedings of the 2003 Asia and South Pacific Design Automation Conference, ASP-DAC '03, Kitakyushu, Japan, January 21-24, 2003. pages 751-756, ACM, 2003. [doi]
@inproceedings{LiouWKC03,
title = {Experience in critical path selection for deep sub-micron delay test and timing validation},
author = {Jing-Jia Liou and Li-C. Wang and Angela Krstic and Kwang-Ting Cheng},
year = {2003},
doi = {10.1145/1119772.1119940},
url = {http://doi.acm.org/10.1145/1119772.1119940},
researchr = {https://researchr.org/publication/LiouWKC03},
cites = {0},
citedby = {0},
pages = {751-756},
booktitle = {Proceedings of the 2003 Asia and South Pacific Design Automation Conference, ASP-DAC '03, Kitakyushu, Japan, January 21-24, 2003},
editor = {Hiroto Yasuura},
publisher = {ACM},
isbn = {0-7803-7660-9},
}