Total Ionizing Dose Hardening of 45 nm FD-SOI MOSFETs Using Body-Tie Biasing - researchr publication authors

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Xiaoqiang Liu, Li Cai, Baojun Liu, Xiaokuo Yang, Huanqing Cui, Cheng Li. Total Ionizing Dose Hardening of 45 nm FD-SOI MOSFETs Using Body-Tie Biasing. IEEE Access, 7:51276-51283, 2019. [doi]

This author has not been identified. Look up 'Xiaoqiang Liu' in GoogleThis author has not been identified. Look up 'Li Cai' in GoogleThis author has not been identified. Look up 'Baojun Liu' in GoogleThis author has not been identified. Look up 'Xiaokuo Yang' in GoogleThis author has not been identified. Look up 'Huanqing Cui' in GoogleThis author has not been identified. Look up 'Cheng Li' in Google

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