Xiaoqiang Liu, Li Cai, Baojun Liu, Xiaokuo Yang, Huanqing Cui, Cheng Li. Total Ionizing Dose Hardening of 45 nm FD-SOI MOSFETs Using Body-Tie Biasing. IEEE Access, 7:51276-51283, 2019. [doi]
@article{LiuCLYCL19,
title = {Total Ionizing Dose Hardening of 45 nm FD-SOI MOSFETs Using Body-Tie Biasing},
author = {Xiaoqiang Liu and Li Cai and Baojun Liu and Xiaokuo Yang and Huanqing Cui and Cheng Li},
year = {2019},
doi = {10.1109/ACCESS.2019.2910845},
url = {https://doi.org/10.1109/ACCESS.2019.2910845},
researchr = {https://researchr.org/publication/LiuCLYCL19},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {7},
pages = {51276-51283},
}