SRAM stability analysis for different cache configurations due to Bias Temperature Instability and Hot Carrier Injection

Taizhi Liu, Chang-Chih Chen, Jiadong Wu, Linda S. Milor. SRAM stability analysis for different cache configurations due to Bias Temperature Instability and Hot Carrier Injection. In 34th IEEE International Conference on Computer Design, ICCD 2016, Scottsdale, AZ, USA, October 2-5, 2016. pages 225-232, IEEE Computer Society, 2016. [doi]

Abstract

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