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X-Tolerant Tunable Compactor for In-System Test

Yingdi Liu, Sylwester Milewski, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer, Bartosz Wldarczak. X-Tolerant Tunable Compactor for In-System Test. In IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020. pages 1-10, IEEE, 2020. [doi]

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Yingdi Liu

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Sylwester Milewski

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Grzegorz Mrugalski

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Nilanjan Mukherjee 0001

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Janusz Rajski

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Jerzy Tyszer

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Bartosz Wldarczak

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