Yingdi Liu, Sylwester Milewski, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer, Bartosz Wldarczak. X-Tolerant Tunable Compactor for In-System Test. In IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020. pages 1-10, IEEE, 2020. [doi]
Abstract is missing.