Yingdi Liu, Sylwester Milewski, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer, Bartosz Wldarczak. X-Tolerant Tunable Compactor for In-System Test. In IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020. pages 1-10, IEEE, 2020. [doi]
@inproceedings{LiuMM0RTW20,
title = {X-Tolerant Tunable Compactor for In-System Test},
author = {Yingdi Liu and Sylwester Milewski and Grzegorz Mrugalski and Nilanjan Mukherjee 0001 and Janusz Rajski and Jerzy Tyszer and Bartosz Wldarczak},
year = {2020},
doi = {10.1109/ITC44778.2020.9325266},
url = {https://doi.org/10.1109/ITC44778.2020.9325266},
researchr = {https://researchr.org/publication/LiuMM0RTW20},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020},
publisher = {IEEE},
isbn = {978-1-7281-9113-3},
}