Equiprobability-Based Local Response Surface Method for High-Sigma Yield Estimation With Both High Accuracy and Efficiency

Xiang Liu, Pengpeng Ren, Hai-Bao Chen, Zhigang Ji, Junhua Liu, Runsheng Wang, Jianfu Zhang 0001, Ru Huang. Equiprobability-Based Local Response Surface Method for High-Sigma Yield Estimation With Both High Accuracy and Efficiency. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(4):1346-1350, April 2023. [doi]

Authors

Xiang Liu

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Pengpeng Ren

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Hai-Bao Chen

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Zhigang Ji

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Junhua Liu

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Runsheng Wang

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Jianfu Zhang 0001

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Ru Huang

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