Xiang Liu, Pengpeng Ren, Hai-Bao Chen, Zhigang Ji, Junhua Liu, Runsheng Wang, Jianfu Zhang 0001, Ru Huang. Equiprobability-Based Local Response Surface Method for High-Sigma Yield Estimation With Both High Accuracy and Efficiency. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(4):1346-1350, April 2023. [doi]
Abstract is missing.