Xiang Liu, Pengpeng Ren, Hai-Bao Chen, Zhigang Ji, Junhua Liu, Runsheng Wang, Jianfu Zhang 0001, Ru Huang. Equiprobability-Based Local Response Surface Method for High-Sigma Yield Estimation With Both High Accuracy and Efficiency. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(4):1346-1350, April 2023. [doi]
@article{LiuRCJLWZH23,
title = {Equiprobability-Based Local Response Surface Method for High-Sigma Yield Estimation With Both High Accuracy and Efficiency},
author = {Xiang Liu and Pengpeng Ren and Hai-Bao Chen and Zhigang Ji and Junhua Liu and Runsheng Wang and Jianfu Zhang 0001 and Ru Huang},
year = {2023},
month = {April},
doi = {10.1109/TCAD.2022.3193875},
url = {https://doi.org/10.1109/TCAD.2022.3193875},
researchr = {https://researchr.org/publication/LiuRCJLWZH23},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {42},
number = {4},
pages = {1346-1350},
}