Bias Busters: Robustifying DL-Based Lithographic Hotspot Detectors Against Backdooring Attacks

Kang Liu 0017, Benjamin Tan, Gaurav Rajavendra Reddy, Siddharth Garg, Yiorgos Makris, Ramesh Karri. Bias Busters: Robustifying DL-Based Lithographic Hotspot Detectors Against Backdooring Attacks. IEEE Trans. on CAD of Integrated Circuits and Systems, 40(10):2077-2089, 2021. [doi]

Authors

Kang Liu 0017

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Benjamin Tan

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Gaurav Rajavendra Reddy

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Siddharth Garg

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Yiorgos Makris

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Ramesh Karri

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