Kang Liu 0017, Benjamin Tan, Gaurav Rajavendra Reddy, Siddharth Garg, Yiorgos Makris, Ramesh Karri. Bias Busters: Robustifying DL-Based Lithographic Hotspot Detectors Against Backdooring Attacks. IEEE Trans. on CAD of Integrated Circuits and Systems, 40(10):2077-2089, 2021. [doi]
Abstract is missing.