Kang Liu 0017, Benjamin Tan, Gaurav Rajavendra Reddy, Siddharth Garg, Yiorgos Makris, Ramesh Karri. Bias Busters: Robustifying DL-Based Lithographic Hotspot Detectors Against Backdooring Attacks. IEEE Trans. on CAD of Integrated Circuits and Systems, 40(10):2077-2089, 2021. [doi]
@article{LiuTRGMK21,
title = {Bias Busters: Robustifying DL-Based Lithographic Hotspot Detectors Against Backdooring Attacks},
author = {Kang Liu 0017 and Benjamin Tan and Gaurav Rajavendra Reddy and Siddharth Garg and Yiorgos Makris and Ramesh Karri},
year = {2021},
doi = {10.1109/TCAD.2020.3033749},
url = {https://doi.org/10.1109/TCAD.2020.3033749},
researchr = {https://researchr.org/publication/LiuTRGMK21},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {40},
number = {10},
pages = {2077-2089},
}