Weihua Liu, Fei Wu 0005, Songmiao Meng, Xiang Chen, Changsheng Xie. Error Generation for 3D NAND Flash Memory. In Cristiana Bolchini, Ingrid Verbauwhede, Ioana Vatajelu, editors, 2022 Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, Antwerp, Belgium, March 14-23, 2022. pages 56-59, IEEE, 2022. [doi]
@inproceedings{LiuWMCX22,
title = {Error Generation for 3D NAND Flash Memory},
author = {Weihua Liu and Fei Wu 0005 and Songmiao Meng and Xiang Chen and Changsheng Xie},
year = {2022},
doi = {10.23919/DATE54114.2022.9774514},
url = {https://doi.org/10.23919/DATE54114.2022.9774514},
researchr = {https://researchr.org/publication/LiuWMCX22},
cites = {0},
citedby = {0},
pages = {56-59},
booktitle = {2022 Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, Antwerp, Belgium, March 14-23, 2022},
editor = {Cristiana Bolchini and Ingrid Verbauwhede and Ioana Vatajelu},
publisher = {IEEE},
isbn = {978-3-9819263-6-1},
}