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Error Generation for 3D NAND Flash Memory

Weihua Liu, Fei Wu 0005, Songmiao Meng, Xiang Chen, Changsheng Xie. Error Generation for 3D NAND Flash Memory. In Cristiana Bolchini, Ingrid Verbauwhede, Ioana Vatajelu, editors, 2022 Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, Antwerp, Belgium, March 14-23, 2022. pages 56-59, IEEE, 2022. [doi]

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