Alan S.-M. Liu, Lowry P.-T. Wang, Charles H.-P. Wen, Herming Chiueh. LESER-2: Detailed Consideration in Latch Design under Process Migration for Prevention of Single-Event Double-Node Upsets. In IEEE International Test Conference, ITC 2024, San Diego, CA, USA, November 3-8, 2024. pages 407-416, IEEE, 2024. [doi]
Abstract is missing.