2 memories: device reliability and depolarization fields - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Patrick D. Lomenzo, Stefan Slesazeck, Michael Hoffmann 0008, Thomas Mikolajick, Uwe Schroeder, Benjamin Max. 2 memories: device reliability and depolarization fields. In 19th Non-Volatile Memory Technology Symposium, NVMTS 2019, Durham, NC, USA, October 28-30, 2019. pages 1-8, IEEE, 2019. [doi]

This author has not been identified. Look up 'Patrick D. Lomenzo' in GoogleThis author has not been identified. Look up 'Stefan Slesazeck' in GoogleThis author has not been identified. Look up 'Michael Hoffmann 0008' in GoogleThis author has not been identified. Look up 'Thomas Mikolajick' in GoogleThis author has not been identified. Look up 'Uwe Schroeder' in GoogleThis author has not been identified. Look up 'Benjamin Max' in Google

runs on WebDSL