Patrick D. Lomenzo, Stefan Slesazeck, Michael Hoffmann 0008, Thomas Mikolajick, Uwe Schroeder, Benjamin Max. 2 memories: device reliability and depolarization fields. In 19th Non-Volatile Memory Technology Symposium, NVMTS 2019, Durham, NC, USA, October 28-30, 2019. pages 1-8, IEEE, 2019. [doi]
Abstract is missing.