Address Remapping Techniques for Enhancing Fabrication Yield of Embedded Memories

Shyue-Kung Lu, Hao-Cheng Jheng, Hao-Wei Lin, Masaki Hashizume. Address Remapping Techniques for Enhancing Fabrication Yield of Embedded Memories. J. Electronic Testing, 34(4):435-446, 2018. [doi]

Authors

Shyue-Kung Lu

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Hao-Cheng Jheng

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Hao-Wei Lin

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Masaki Hashizume

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