Shyue-Kung Lu, Hao-Cheng Jheng, Hao-Wei Lin, Masaki Hashizume. Address Remapping Techniques for Enhancing Fabrication Yield of Embedded Memories. J. Electronic Testing, 34(4):435-446, 2018. [doi]
@article{LuJLH18,
title = {Address Remapping Techniques for Enhancing Fabrication Yield of Embedded Memories},
author = {Shyue-Kung Lu and Hao-Cheng Jheng and Hao-Wei Lin and Masaki Hashizume},
year = {2018},
doi = {10.1007/s10836-018-5741-x},
url = {https://doi.org/10.1007/s10836-018-5741-x},
researchr = {https://researchr.org/publication/LuJLH18},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {34},
number = {4},
pages = {435-446},
}