The following publications are possibly variants of this publication:
- Fault-Aware Page Address Remapping Techniques for Enhancing Yield and Reliability of Flash MemoriesShyue-Kung Lu, Shu-Chi Yu, Masaki Hashizume, Hiroyuki Yotsuyanagi. ats 2017: 254-259 [doi]
- Integration of Hard Repair Techniques with ECC for Enhancing Fabrication Yield and Reliability of Embedded MemoriesShyue-Kung Lu, Cheng-Ju Tsai, Masaki Hashizume. ats 2015: 49-54 [doi]
- Enhanced Built-In Self-Repair Techniques for Improving Fabrication Yield and Reliability of Embedded MemoriesShyue-Kung Lu, Cheng-Ju Tsai, Masaki Hashizume. tvlsi, 24(8):2726-2734, 2016. [doi]
- Fault Scrambling Techniques for Yield Enhancement of Embedded MemoriesShyue-Kung Lu, Hao-Cheng Jheng, Masaki Hashizume, Jiun-Lang Huang, Pony Ning. ats 2013: 215-220 [doi]
- An enhanced built-in self-repair technique for yield and reliability improvement of embedded memoriesShyue-Kung Lu, Hao-Wei Lin, Masaki Hashizume. asicon 2015: 1-4 [doi]
- Built-In Scrambling Analysis for Yield Enhancement of Embedded MemoriesShyue-Kung Lu, Hao-Cheng Jheng, Hao-Wei Lin, Masaki Hashizume, Seiji Kajihara. ats 2014: 137-142 [doi]
- Synergistic Reliability and Yield Enhancement Techniques for Embedded SRAMsShyue-Kung Lu, Huan-Hua Huang, Jiun-Lang Huang, Pony Ning. tcad, 32(1):165-169, 2013. [doi]
- Yield enhancement techniques for 3-dimensional random access memoriesShyue-Kung Lu, Tin-Wei Chang, Han-Yu Hsu. mr, 52(6):1065-1070, 2012. [doi]