The following publications are possibly variants of this publication:
- A Built-In Self-Repair Scheme for Semiconductor Memories with 2-D RedundancyJin-Fu Li, Jen-Chieh Yeh, Rei-Fu Huang, Cheng-Wen Wu, Peir-Yuan Tsai, Archer Hsu, Eugene Chow. itc 2003: 393-402 [doi]
- Built-in redundancy analysis for memory yield improvementChih-Tsun Huang, Chi-Feng Wu, Jin-Fu Li, Cheng-Wen Wu. tr, 52(4):386-399, 2003. [doi]
- A Simulator for Evaluating Redundancy Analysis Algorithms of Repairable Embedded MemoriesRei-Fu Huang, Jin-Fu Li, Jen-Chieh Yeh, Cheng-Wen Wu. mtdt 2002: 68 [doi]